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VDI/VDE 2655 Blatt 1.1:2024-01
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
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Summary
Optische Messtechnik an Mikrotopografien - Kalibrieren von Interferenzmikroskopen und Tiefeneinstellnormalen für die Rauheitsmessung
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/2024 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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