Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
€201.00
Semiconductor die products Questionnaire for users and suppliers
€329.00
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
€172.00
Semiconductor devices Generic specification for discrete and integrated circuits
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration MEMS structures
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide packages Silicon Fine-pitch Ball Grid Array and Land (S-FBGA S-FLGA)
Semiconductor devices. Micro-electromechanical devices Electronic compasses
Semiconductor devices. Discrete devices Magnetic and capacitive coupler for basic reinforced isolation
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Semiconductor devices. Micro-electromechanical devices Gyroscopes
€390.00
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices. interface for human body communication General requirements
Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection
