Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength micro bonding area
€281.00
Semiconductor devices. devices for energy harvesting and generation Vibration based piezoelectric
€266.00
Semiconductor devices. devices for energy harvesting and generation Thermo power based thermoelectric
€201.00
Semiconductor devices. Stress migration test standard Copper stress
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) method for semiconductor devices
Semiconductor devices. interface for human body communication Functional type and its operational conditions
Semiconductor devices. devices for energy harvesting and generation Vibration based electromagnetic
Semiconductor devices Microwave integrated circuits. Amplifiers
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Semiconductor devices. Discrete devices Optoelectronic Photocouplers
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Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
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Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
