31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
NF EN 62047-17, C96-050-17 (11/2015)

NF EN 62047-17, C96-050-17 (11/2015)

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Semiconductor devices - Micro-electromechanical devices - Part 17 : bulge test method for measuring mechanical properties of thin films - Dispositifs à semiconducteurs

€120.00

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NF EN 62504/A1, C71-504/A1 (05/2018)

NF EN 62504/A1, C71-504/A1 (05/2018)

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General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions - Eclairage général - Produits à diode électroluminescente (LED) et équipements associés - Termes et définitions

€42.67

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NF EN 62047-1, C96-050-1 (11/2016)

NF EN 62047-1, C96-050-1 (11/2016)

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Semiconductor devices - Micro-electromechanical devices - Part 1 : terms and definitions

€98.42

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NF EN 60191-6-13, C96-013-6-13 (01/2017)

NF EN 60191-6-13, C96-013-6-13 (01/2017)

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Mechanical standardization of semiconductor devices - Part 6-13 : design guideline of open-top-type sockets for fine-pitch ball grid array (FBGA) and fine-pitch land grid array (FLGA)

€85.42

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NF EN 60747-16-1/A2, C96-016-1/A2 (08/2017)

NF EN 60747-16-1/A2, C96-016-1/A2 (08/2017)

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Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers

€76.00

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NF EN 60749-43, C96-022-43 (09/2017)

NF EN 60749-43, C96-022-43 (09/2017)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 43 : guidelines for IC reliability qualification plans - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43 : Directives concernant les plans de qualification de la fiabilité des CI

€131.33

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NF EN 60749-44, C96-022-44 (12/2016)

NF EN 60749-44, C96-022-44 (12/2016)

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Semiconductor devices - Mechanical and climatic test methods - Part 44 : neutron beam irradiated single event effect (SEE) test method for semiconductor devices

€109.00

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NF EN 60749-3, C96-022-3 (06/2017)

NF EN 60749-3, C96-022-3 (06/2017)

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Semiconductor devices - Mechanical and climatic test methods - Part 3 : external visual examination

€76.00

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NF EN 60749-4, C96-022-4 (06/2017)

NF EN 60749-4, C96-022-4 (06/2017)

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Semiconductor devices - Mechanical and climatic test methods - Part 4 : Damp Heat, steady state, highly accelerated stress test (HAST)

€76.00

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NF EN 60749-6, C96-022-6 (06/2017)

NF EN 60749-6, C96-022-6 (06/2017)

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Semiconductor devices - Mechanical and climatic test methods - Part 6 : storage at high temperature

€58.00

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NF EN 60749-9, C96-022-9 (06/2017)

NF EN 60749-9, C96-022-9 (06/2017)

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Semiconductor devices - Mechanical and climatic test methods - Part 9 : permanence of marking

€76.00

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NF EN 60747-16-3/A2, C96-016-3/A2 (12/2017)

NF EN 60747-16-3/A2, C96-016-3/A2 (12/2017)

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Semiconductor devices - Part 16-3 : microwave integrated circuits - Frequency converters

€58.00

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NF EN 60747-16-4/A2, C96-016-4/A2 (11/2017)

NF EN 60747-16-4/A2, C96-016-4/A2 (11/2017)

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Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches

€58.00

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NF EN 61975/A1, C53-975/A1 (04/2017)

NF EN 61975/A1, C53-975/A1 (04/2017)

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High-voltage direct current (HVDC) installations - System tests

€99.97

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NF EN IEC 60191-1, C96-013-1 (03/2018)

NF EN IEC 60191-1, C96-013-1 (03/2018)

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Normalisation mécanique des dispositifs à semi-conducteurs - Partie 1 : règles générales pour la préparation des dessins d'encombrement des dispositifs discrets

€131.33

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