IEC 822 VSB. PARALLEL SUB-SYSTEM BUS OF THE IEC 821 VMEBUS.
€157.00
Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
€96.59
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM) (IEC 47/1624/CDV:2002); German version prEN 60749-27:2002
€63.27
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing; Human body model (HBM) (IEC 47/1623/CDV:2002); German version prEN 60749-26:2002
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 47/1615/CDV:2002); German version prEN 60749-14:2002
€69.91
Semiconductor devices - Mechanical and climatic test methods - Part 25: Rapid change of temperature (air, air) (IEC 47/1616/CDV:2002); German version prEN 60749-25:2002
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/1625/CDV:2002); German version prEN 60749-29:2002
€91.03
Discrete semiconductor devices - Part 14-4: Semiconductor accelerometers (IEC 47E/220/CD:2002).
€248.22
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/1636/CD:2002)
€48.79
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance; Unbiased autoclave (IEC 47/1637/CD:2002)
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power Cycling (IEC 47/1648/CD:2002)
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2002); German version EN 60749-7:2002.
€56.17
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing; Charged device model (CDM) (IEC 47/1658/CD:2002)
Semiconductor devices - Discrete devices - Part 7-5: Bipolar transistors (BTRs) for power switching applications (IEC 47E/234/CD:2002)
€111.40
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 47/1682/CD:2003)
