31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN IEC 47(CO)1073:1988-10

DIN IEC 47(CO)1073:1988-10

Withdrawn Most Recent

Semiconductor devices; term and letter symbol for leakage current; identical with IEC 47(Central Office)1073

€34.30

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DIN IEC 47(CO)1076:1988-10

DIN IEC 47(CO)1076:1988-10

Withdrawn Most Recent

Semiconductor devices; revised definition of "forward recovery time" for rectifier diodes and signal diodes; identical with IEC 47(Central Office)1076

€34.30

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DIN IEC 47(CO)1075:1988-11

DIN IEC 47(CO)1075:1988-11

Superseded Historical

Semiconductor devices; measuring methods for recovered charge of rectifier diodes and thyristors; identical with IEC 47(Central Office)1075

€41.78

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DIN IEC 47(CO)1053:1988-12

DIN IEC 47(CO)1053:1988-12

Withdrawn Most Recent

Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053

€56.17

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DIN IEC 47(CO)1042:1988-12

DIN IEC 47(CO)1042:1988-12

Superseded Historical

Semiconductor devices; measuring methods for matched-pair bipolar transistors; identical with IEC 47(Central Office)1042

€34.30

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DIN IEC 47(CO)1041:1989-01

DIN IEC 47(CO)1041:1989-01

Withdrawn Most Recent

Semiconductor devices; measuring method of transition time for snap-off- diodes; identical with IEC 47(Central Office)1041

€34.30

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DIN IEC 47(CO)1053-2:1989-03

DIN IEC 47(CO)1053-2:1989-03

Withdrawn Most Recent

Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053-II

€77.20

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DIN IEC 47(CO)985:1989-04

DIN IEC 47(CO)985:1989-04

Withdrawn Most Recent

IEC quality assessment system for electronic components: blank detail specification for bipolar transistors for switching applications; identical with IEC 47(Central Office)985

€56.17

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DIN IEC 47(CO)1084:1989-04

DIN IEC 47(CO)1084:1989-04

Superseded Historical

Semiconductor devices; mechanical and climatic test methods; amendment to IEC 60749; identical with IEC 47(Central Office)1084

€34.30

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DIN IEC 47(CO)1092:1989-04

DIN IEC 47(CO)1092:1989-04

Withdrawn Most Recent

Semiconductor devices; amendment to the generic specification; IEC 60747-10/QC 700000; identical with IEC 47(Central Office)1092

€34.30

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DIN IEC 47(CO)1116:1989-05

DIN IEC 47(CO)1116:1989-05

Withdrawn Most Recent

Semiconductor devices; amendment to the generic specification IEC 60747-10; accelerated test procedures; identical with IEC 47/47A(Central Office)1116/205

€34.30

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DIN IEC 47(CO)1074:1989-05

DIN IEC 47(CO)1074:1989-05

Withdrawn Most Recent

Semiconductor devices - Measuring methods for forward recovery time of rectifier diodes and signal diodes; Identical with IEC 47(Central Office)1074

€34.30

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DIN IEC 60747-8:1989-08

DIN IEC 60747-8:1989-08

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Field-effect transistors; Identical with IEC 60747-8:1984

€105.42

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DIN IEC 47(CO)1054:1989-08

DIN IEC 47(CO)1054:1989-08

Superseded Historical

Semiconductor devices; mechanical and climatic test methods; supplements to IEC 749; damp heat; identical with IEC 47(Central Office)1054

€34.30

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DIN IEC 47(CO)1108:1989-08

DIN IEC 47(CO)1108:1989-08

Withdrawn Most Recent

Semiconductor devices; terms and definitions for leakage current of analogue signal switching circuits; identical with IEC 47(Central Office)1108

€34.30

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