Gas analysis. Comparison methods for determining and checking the composition of calibration gas mixtures
€329.00
Chemical analysis of refractories containing alumina, zirconia and silica. Refractories 5 percent to 45 ZrO2 (alternative the X-ray fluorescence method) Apparatus, reagents dissolution
€201.00
Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories 5 percent to 45 ZrO2 (alternative the X-ray fluorescence method) Wet chemical
€281.00
Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories 5 percent to 45 ZrO2 (alternative the X-ray fluorescence method) Flame atomic absorption spectrophotometry (FAAS) inductively coupled plasma emission spectrometry (ICP-AES)
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Continuous syringe injection method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Gas mixtures. Gravimetric preparation. Mastering correlations in composition
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Gas analysis. Investigation and treatment of analytical bias
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
