Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
€329.00
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
€281.00
Breath alcohol test devices for general public. Requirements and test methods
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I
€370.00
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Gas analysis. Vocabulary
Alcohol interlocks. Test methods and performance requirements Instruments for drink-driving-offender programs
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Expression of performance of fluorometric oxygen analyzers in liquid media
BS ISO 18115-2 AMD1. Surface chemical analysis. Vocabulary. Part 2. Terms used in scanning-probe microscopy
€24.00
BS ISO 18115-1 AMD1. Surface chemical analysis. Vocabulary. Part 1. General terms and terms used in spectroscopy
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Critical flow orifices
Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy. Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
€201.00
Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
