Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
€281.00
Alcohol interlocks. Test methods and performance requirements Data security
€390.00
Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
€329.00
Surface chemical analysis. Vocabulary General terms and used in spectroscopy
€421.00
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Expression of performance gas analyzers Photometric
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
BS ISO 18516. Surface chemical analysis. Determination of lateral resolution and sharpness in beam based methods
€24.00
Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
Expression of performance gas analyzers Measuring oxygen in utilizing high-temperature electrochemical sensors
Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
€201.00
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
