Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
€281.00
Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
€201.00
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Surface chemical analysis. Data transfer format for scanning-probe microscopy
€329.00
Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
Breath alcohol test devices other than single use devices. Requirements and test methods
Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
€390.00
Surface chemical analysis. Characterization of nanostructured materials
€370.00
Natural gas. Performance evaluation for analytical systems
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Piston pumps
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
€421.00
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Capillary devices
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
