31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
26/30510433 DC:2026

26/30510433 DC:2026

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Draft BS EN 62047-54 Ed.1.0 Micro-electromechanical devices Part 54: Silicon based MEMS fabrication technology - Test method of microstructure tensile

€24.00

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26/30543279 DC:2025

26/30543279 DC:2025

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BS EN IEC 62047-57 Micro-electromechanical systems Part 57: RF MEMS directional coupler

€24.00

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IEC 60749-26:2025

IEC 60749-26:2025

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IEC 60749-26:2025 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

€389.00

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IEC 60749-21:2025

IEC 60749-21:2025

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IEC 60749-21:2025 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability

€186.00

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IEC 60749-23:2025

IEC 60749-23:2025

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IEC 60749-23:2025 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

€46.00

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BS IEC 62047-49:2025

BS IEC 62047-49:2025

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Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers

€172.00

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IEC 60749-24:2025

IEC 60749-24:2025

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IEC 60749-24:2025 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

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IEC 60749-7:2025

IEC 60749-7:2025

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IEC 60749-7:2025 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

€93.00

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IEC 60749-22-1:2025

IEC 60749-22-1:2025

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IEC 60749-22-1:2025 Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods

€441.00

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IEC 60749-22-2:2025

IEC 60749-22-2:2025

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IEC 60749-22-2:2025 Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods

€302.00

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25/30461045 DC:2025

25/30461045 DC:2025

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Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy

€44.00

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25/30510415 DC:2025

25/30510415 DC:2025

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Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods performance for ultrasonic

€24.00

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25/30510419 DC:2025

25/30510419 DC:2025

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Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods performance for visual imaging

€24.00

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25/30539990 DC:2025

25/30539990 DC:2025

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Draft BS EN 63364-2 Semiconductor devices - for IoT system Part 2: Test method of semiconductor photon sources incorporating human factors wearable equipment

€24.00

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BS IEC 63150-2:2025

BS IEC 63150-2:2025

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Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human arm swing motion

€281.00

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