Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021.
€145.14
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022
€84.58
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022.
€105.42
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods detection performance for LiDAR
€24.00
MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES. PART 4: CODING SYSTEM AND CLASSIFICATION INTO FORMS OF PACKAGE OUTLINES FOR SEMICONDUCTOR DEVICES.
€35.00
SEMICONDUCTOR DEVICES. MECHANICAL AND CLIMATIC TEST METHODS.
€71.00
Semiconductor devices - Mechanical and climatic test methods
€97.00
Semiconductor devices - Mechanical and climatic test methods.
€58.00
€79.00
Semiconductor devices - Mechanical and climatic test methods -- Part 7: Internal moisture content measurement and the analysis of other residual gases.
€47.00
Semiconductor devices - Mechanical and climatic test methods -- Part 15: Resistance to soldering temperature for through-hole mounted devices
€40.00
Mechanical standardization of semiconductor devices -- Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA) - Rectangular type
€69.00
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
€73.00
Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
€50.00
