Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)
€63.27
IEC 61748: Manufacturing line approval for MCM (QML) (IEC 47A/541/CDV:1999, text in English)
€48.79
Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 1: General and definitions (IEC 47A/569/CD:1999)
€84.58
Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions 1 ohm/150 ohm; direct coupling method (IEC 47A/566/CD:1999)
€105.42
Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions, workbench Faraday cage method (IEC 47A/567A/CD:1999)
Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 6: Measurement of RF currents, magnetic probe method (IEC 47A/568/CD:1999)
€91.03
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 47/2172/CD:2013)
€116.64
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration Mechanisms (IEC 47/2173/CD:2013)
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die & Wafer Devices (IEC 47/2174/CD:2013)
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 47E/522/CD:2015)
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2008); German version EN 62433-2:2010.
€140.00
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 47A/839/CD:2010)
€122.34
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002)
€0.00
€69.91
